Invention Grant
US08391980B2 Method and system for identifying a potential lead failure in an implantable medical device
有权
用于识别可植入医疗装置中的潜在导联故障的方法和系统
- Patent Title: Method and system for identifying a potential lead failure in an implantable medical device
- Patent Title (中): 用于识别可植入医疗装置中的潜在导联故障的方法和系统
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Application No.: US12498982Application Date: 2009-07-07
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Publication No.: US08391980B2Publication Date: 2013-03-05
- Inventor: Gene A. Bornzin , John W. Poore , Richard Williamson , Gabriel A. Mouchawar , Eric S. Fain
- Applicant: Gene A. Bornzin , John W. Poore , Richard Williamson , Gabriel A. Mouchawar , Eric S. Fain
- Applicant Address: US CA Sylmar
- Assignee: Pacesetter, Inc.
- Current Assignee: Pacesetter, Inc.
- Current Assignee Address: US CA Sylmar
- Main IPC: A61N1/00
- IPC: A61N1/00

Abstract:
A method for detecting potential failures by a lead of an implantable medical device is provided. The method includes sensing a first signal over a first channel between a first combination of electrodes on the lead and sensing a second signal from a second channel between a second combination of electrodes on the lead. The method determines whether at least one of the first and second signals is representative of a potential failure in the lead and identifies a failure and the electrode associated with the failure based on which of the first and second sensed signals is representative of the potential failure. Optionally, when the first and second sensed signals are both representative of the potential failure, the method further includes determining whether the first and second sensed signals are correlated with one another. When the first and second sensed signals are correlated, the method declares an electrode common to both of the first and second combinations to be associated with the failure.
Public/Granted literature
- US20110009918A1 METHOD AND SYSTEM FOR IDENTIFYING A POTENTIAL LEAD FAILURE IN AN IMPLANTABLE MEDICAL DEVICE Public/Granted day:2011-01-13
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