Invention Grant
US08391585B2 Defect detecting device, defect detecting method, image sensor device, image sensor module, defect detecting program, and computer-readable recording medium
有权
缺陷检测装置，缺陷检测方法，图像传感器装置，图像传感器模块，缺陷检测程序和计算机可读记录介质
- Patent Title: Defect detecting device, defect detecting method, image sensor device, image sensor module, defect detecting program, and computer-readable recording medium
- Patent Title (中): 缺陷检测装置，缺陷检测方法，图像传感器装置，图像传感器模块，缺陷检测程序和计算机可读记录介质
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Application No.: US11964602Application Date: 2007-12-26
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Publication No.: US08391585B2Publication Date: 2013-03-05
- Inventor: Toshimasa Kuchii
- Applicant: Toshimasa Kuchii
- Applicant Address: JP Osaka
- Assignee: Sharp Kabushiki Kaisha
- Current Assignee: Sharp Kabushiki Kaisha
- Current Assignee Address: JP Osaka
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2006-355595 20061228; JP2007-316181 20071206
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
A defect detecting device includes a pixel value correcting section, a block-division processing section, and a defective/non-defective determining section. The pixel value correcting section corrects a pixel value of an inspection-target image, on which detection of a defective area is to be carried out, in such a manner that the defective area of the inspection-target image is emphasized with respect to the other areas of the inspection-target image. The block-division processing section divides, into plural blocks, the inspection-target image with pixel values having been corrected, and obtains a block addition value or a block mean value. The defective/non-defective determining section determines whether or not the defective area is present by carrying out statistical processing to determine whether an outlier of the block addition value or an outlier of the block mean value is present or not.
Public/Granted literature
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