Invention Grant
- Patent Title: Apparatus and method for detecting interference wave
- Patent Title (中): 用于检测干扰波的装置和方法
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Application No.: US12609250Application Date: 2009-10-30
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Publication No.: US08391348B2Publication Date: 2013-03-05
- Inventor: Hiroji Akahori
- Applicant: Hiroji Akahori
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, PLLC
- Priority: JP2008-292018 20081114
- Main IPC: H04L27/01
- IPC: H04L27/01

Abstract:
An interference wave detecting apparatus includes a first Fourier transformer for frequency-converting a received signal; an extractor for extracting a known information signal from the frequency-converted received signal; an interpolator for performing interpolation to the known information signal in frequency domain, generating a first transmission path estimation signal as a frequency-domain information signal; an inverse Fourier transformer for inverse-Fourier-transforming the known information signal, generating a time-domain information signal; a waveform shaping section for shaping a waveform of the time-domain information signal; a second Fourier transformer for Fourier-transforming the shaped time-domain information signal, generating a second transmission path estimation signal as a frequency-domain information signal; and a comparing-computing section for comparing the first and second transmission path estimation signals, generating an interference wave detection result which indicates a ratio of an interference wave of the received signal.
Public/Granted literature
- US20100124267A1 APPARATUS AND METHOD FOR DETECTING INTERFERENCE WAVE Public/Granted day:2010-05-20
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