Invention Grant
- Patent Title: Lithographic apparatus and device manufacturing method
- Patent Title (中): 平版印刷设备和器件制造方法
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Application No.: US11733327Application Date: 2007-04-10
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Publication No.: US08390787B2Publication Date: 2013-03-05
- Inventor: Cheng-Qun Gui , Pieter Willem Herman De Jager , Robert-Han Munning Schmidt
- Applicant: Cheng-Qun Gui , Pieter Willem Herman De Jager , Robert-Han Munning Schmidt
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: G03B27/72
- IPC: G03B27/72 ; G03B27/42 ; G03B27/54

Abstract:
A lithographic apparatus comprises an illumination system for supplying a beam of radiation, a patterning arrangement incorporating an array of individually controllable elements for imparting a pattern to the beam cross-section, a substrate table for supporting a substrate, and a projection system incorporating a microlens array for projecting the beam onto a target portion of the substrate. An error compensator is provided for supplying error correction values for compensating for the effect of positional errors in the microlens array, and a grey scale modulator is provided for supplying drive signals to controllable elements of the patterning arrangement in dependence on the error correction values in order to compensate for the effect of positional errors in the microlens array by varying the intensity of some parts of the pattern relative to other parts of the pattern.
Public/Granted literature
- US20070242246A1 Lithographic Apparatus and Device Manufacturing Method Public/Granted day:2007-10-18
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