Various embodiments of a delay locked loop circuit of a semiconductor memory apparatus are disclosed. In one exemplary embodiment, the delay locked loop circuit may include an input correction unit configured to correct a duty ratio of an input clock based on a duty control signal and generate a reference clock; a delay line configured to delay the reference clock by a delay time and generate a delay locked clock; an output correction unit configured to correct a duty ratio of the delay locked clock based on the duty control signal and generate a corrected clock; and a control signal generation unit configured to generate the duty control signal when a correction activation signal is enabled.