Invention Grant
- Patent Title: Nitride semiconductor device
- Patent Title (中): 氮化物半导体器件
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Application No.: US12104818Application Date: 2008-04-17
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Publication No.: US08390030B2Publication Date: 2013-03-05
- Inventor: Wataru Saito , Hidetoshi Fujimoto , Takao Noda , Yasunobu Saito , Tomohiro Nitta
- Applicant: Wataru Saito , Hidetoshi Fujimoto , Takao Noda , Yasunobu Saito , Tomohiro Nitta
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-121352 20070502
- Main IPC: H01L29/778
- IPC: H01L29/778

Abstract:
A semiconductor device includes: a first semiconductor layer made of an AlxGa1−xN (0≦×
Public/Granted literature
- US20080277692A1 SEMICONDUCTOR DEVICE Public/Granted day:2008-11-13
Information query
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