Invention Grant
- Patent Title: Memory using tunneling field effect transistors
- Patent Title (中): 存储器采用隧道场效应晶体管
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Application No.: US12975997Application Date: 2010-12-22
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Publication No.: US08389973B2Publication Date: 2013-03-05
- Inventor: Thomas Nirschl
- Applicant: Thomas Nirschl
- Applicant Address: DE Munich
- Assignee: Qimonda AG
- Current Assignee: Qimonda AG
- Current Assignee Address: DE Munich
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: H01L45/00
- IPC: H01L45/00

Abstract:
A memory includes a first tunneling field effect transistor including a first drain and a first source, the first drain coupled to a first resistive memory element. The memory includes a second tunneling field effect transistor including a second drain and sharing the first source, the second drain coupled to a second resistive memory element. The memory includes a first region coupled to the first source for providing a source node.
Public/Granted literature
- US20110089392A1 MEMORY USING TUNNELING FIELD EFFECT TRANSISTORS Public/Granted day:2011-04-21
Information query
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