Invention Grant
- Patent Title: Charged particle beam apparatus permitting high-resolution and high-contrast observation
- Patent Title (中): 带电粒子束装置允许高分辨率和高对比度观察
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Application No.: US12385612Application Date: 2009-04-14
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Publication No.: US08389935B2Publication Date: 2013-03-05
- Inventor: Muneyuki Fukuda , Naomasa Suzuki , Tomoyasu Shojo , Noritsugu Takahashi
- Applicant: Muneyuki Fukuda , Naomasa Suzuki , Tomoyasu Shojo , Noritsugu Takahashi
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Stites & Harbison, PLLC
- Agent Juan Carlos A. Marquez, Esq.; Nicholas B. Trenkle, Esq.
- Priority: JP2008-104232 20080414
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G21K7/00

Abstract:
A lower pole piece of an electromagnetic superposition type objective lens is divided into an upper magnetic path and a lower magnetic path. A voltage nearly equal to a retarding voltage is applied to the lower magnetic path. An objective lens capable of acquiring an image with a higher resolution and a higher contrast than a conventional image is provided. An electromagnetic superposition type objective lens includes a magnetic path that encloses a coil, a cylindrical or conical booster magnetic path that surrounds an electron beam, a control magnetic path that is interposed between the coil and sample, an accelerating electric field control unit that accelerates the electron beam using a booster power supply, a decelerating electric field control unit that decelerates the electron beam using a stage power supply, and a suppression unit that suppresses electric discharge of the sample using a control magnetic path power supply. Thus, whether landing energy of an electron beam varies widely, the electron beam can be focused with the electromagnetic superposition type objective lens approached to the sample.
Public/Granted literature
- US20090256076A1 CHARGED PARTICLE BEAM APPARATUS PERMITTING HIGH-RESOLUTION AND HIGH-CONTRAST OBSERVATION Public/Granted day:2009-10-15
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