Invention Grant
- Patent Title: Method for producing surface emitting semiconductor device
- Patent Title (中): 表面发射半导体器件的制造方法
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Application No.: US13267104Application Date: 2011-10-06
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Publication No.: US08389308B2Publication Date: 2013-03-05
- Inventor: Yutaka Onishi
- Applicant: Yutaka Onishi
- Applicant Address: JP Osaka
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2010-233690 20101018
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method for producing a surface emitting semiconductor device includes a step of forming a semiconductor stacked structure including an active layer, a first semiconductor layer containing aluminum on the active layer, and a DBR portion, on the first semiconductor layer, to include alternating stacked second semiconductor layers and third semiconductor layers having different aluminum contents; a step of forming a mesa portion by etching the DBR portion and the first semiconductor layer; an oxidation step of oxidizing the first semiconductor layer from a side face of the mesa portion toward the inside of the mesa portion to form an annular oxidized region inside the first semiconductor layer; a first etching step of selectively etching an oxidized region formed in the DBR portion; and a second etching step of removing a peripheral portion of the DBR portion.
Public/Granted literature
- US20120094408A1 METHOD FOR PRODUCING SURFACE EMITTING SEMICONDUCTOR DEVICE Public/Granted day:2012-04-19
Information query
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