Invention Grant
- Patent Title: Scanning probe microscope
- Patent Title (中): 扫描探针显微镜
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Application No.: US12921832Application Date: 2009-03-12
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Publication No.: US08387161B2Publication Date: 2013-02-26
- Inventor: Martin F. Finlan , Shelley J. Wilkins
- Applicant: Martin F. Finlan , Shelley J. Wilkins
- Applicant Address: GB South Yorkshire
- Assignee: Orbital Instruments Limited
- Current Assignee: Orbital Instruments Limited
- Current Assignee Address: GB South Yorkshire
- Agency: Carmody & Torrance LLP
- Priority: GB0804629.4 20080312
- International Application: PCT/GB2009/050238 WO 20090312
- International Announcement: WO2009/112861 WO 20090917
- Main IPC: G01Q60/24
- IPC: G01Q60/24

Abstract:
An elongate probe (50) for use in probe microscopy comprises a module (51) provided between a probe tip (53) and a driver (52). In use the driver (52) applies oscillations to the module (51) which are transmitted by the module to the tip (53). With the probe tip (53) positioned close to the surface of a sample, any phase variance in the oscillation of the tip with respect to the driving oscillation is representative of an interaction between the tip and the sample surface. The elongate arrangement of the probe (50) is particularly beneficial when used to probe samples which require a liquid environment.
Public/Granted literature
- US20110035849A1 SPM Imaging Apparatus, Probe and Method Public/Granted day:2011-02-10
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