In a scanning-capable latch circuit, main latch circuits respectively corresponding to data inputs D1 to D4 are connected in series and, except the last-stage main latch circuit, the scanning output from each main latch circuit becomes the scanning input for the subsequent main latch circuit; while the scanning output from the last-stage main latch circuit becomes the scanning input for a slave latch circuit. Hence, in the scanning-capable latch circuit used in an information processing apparatus, the circuit area can be reduced and scanning can be performed with a small-scale circuit.