Invention Grant
US08385503B2 X-ray diffraction contrast tomography (DCT) system, and an x-ray diffraction contrast tomography (DCT) method
有权
X射线衍射对比层析成像(DCT)系统和X射线衍射对比层析成像(DCT)方法
- Patent Title: X-ray diffraction contrast tomography (DCT) system, and an x-ray diffraction contrast tomography (DCT) method
- Patent Title (中): X射线衍射对比层析成像(DCT)系统和X射线衍射对比层析成像(DCT)方法
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Application No.: US12913034Application Date: 2010-10-27
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Publication No.: US08385503B2Publication Date: 2013-02-26
- Inventor: Erik Mejdal Lauridsen , Henning Friis Poulsen
- Applicant: Erik Mejdal Lauridsen , Henning Friis Poulsen
- Applicant Address: DK Lyngby
- Assignee: Danmarks Tekniske Universitet
- Current Assignee: Danmarks Tekniske Universitet
- Current Assignee Address: DK Lyngby
- Agency: Sughrue Mion, PLLC
- Priority: DK201070324 20100709
- Main IPC: G01N23/207
- IPC: G01N23/207

Abstract:
An X-ray diffraction contrast tomography system (DCT) comprising a laboratory X-ray source (2), a staging device (5) rotating a polycrystalline material sample in the direct path of the X-ray beam, a first X-ray detector (6) detecting the direct X-ray beam being transmitted through the crystalline material sample, a second X-ray detector (7) positioned between the staging device and the first X-ray detector for detecting diffracted X-ray beams, and a processing device (15) for analysing detected values. The crystallographic grain orientation of the individual grain in the polycrystalline sample is determined based on the two-dimensional position of extinction spots and the associated angular position of the sample for a set of extinction spots pertaining to the individual grain.
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