Invention Grant
- Patent Title: Cartridge for automatic measurement and measuring device using the same
- Patent Title (中): 墨盒用于自动测量和测量装置使用
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Application No.: US11332269Application Date: 2006-01-17
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Publication No.: US08383421B2Publication Date: 2013-02-26
- Inventor: Atsushi Yanagida , Takashi Kurihara , Hiroyuki Yokoi , Atsushi Koyata , Yoshikazu Okamura , Daishi Miyamoto
- Applicant: Atsushi Yanagida , Takashi Kurihara , Hiroyuki Yokoi , Atsushi Koyata , Yoshikazu Okamura , Daishi Miyamoto
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Chemical Medience Corporation
- Current Assignee: Mitsubishi Chemical Medience Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2003-198427 20030717
- Main IPC: G01N1/10
- IPC: G01N1/10
Abstract:
An object of the present invention is to provide a cartridge for automatic measurement used in an automatic measuring device, capable of automatically performing measurement including heat treatment of a sample, and a measuring device using the cartridge.The present invention relates to a cartridge for use in measuring a component to be measured contained in a sample, comprising: at least a heat-treatment well for performing heat treatment of the sample; and a reaction well for reacting the component to be measured in the sample with a material specifically reacting therewith.
Public/Granted literature
- US20060183217A1 Cartridge for automatic measurement and measuring device using the same Public/Granted day:2006-08-17
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