Invention Grant
- Patent Title: Methods using metal oxide particles for analyte detection
- Patent Title (中): 使用金属氧化物颗粒进行分析物检测的方法
-
Application No.: US12175673Application Date: 2008-07-18
-
Publication No.: US08383337B2Publication Date: 2013-02-26
- Inventor: Su Lu , Li Zhu , Zhida Pan , Liangliang Qiang , John Yupeng Gui
- Applicant: Su Lu , Li Zhu , Zhida Pan , Liangliang Qiang , John Yupeng Gui
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jenifer W. Haeckl
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C07H21/04 ; C07K5/00

Abstract:
A method includes binding a probe to an analyte present in a sample, wherein the probe comprises a binder bonded to a metal particle that is capable of releasing metal ions when contacted with a reagent solution. The method includes contacting the metal particle with the reagent solution to release the metal ions, and observing an optical signal from the released metal ions to determine a presence or amount of the analyte in the sample. An associated kit is also provided.
Public/Granted literature
- US20100015633A1 METHODS AND KIT FOR ANALYTE DETECTION Public/Granted day:2010-01-21
Information query