Invention Grant
- Patent Title: Debugging device and debugging method
- Patent Title (中): 调试器和调试方法
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Application No.: US12273934Application Date: 2008-11-19
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Publication No.: US08370810B2Publication Date: 2013-02-05
- Inventor: Yuichi Oda
- Applicant: Yuichi Oda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-309260 20071129
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/00
Abstract:
A debugging device configured to debug a program includes an analysis section configured to analyze information of a code that does not need to be debugged in which a predetermined processing instruction is described, the code being generated by optimization of a compiler for a source code of the program, and an output section configured to output processing content information, a start address, and an end address of the code that does not need to be debugged which are obtained by the analysis.
Public/Granted literature
- US20090144705A1 DEBUGGING DEVICE AND DEBUGGING METHOD Public/Granted day:2009-06-04
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