Invention Grant
- Patent Title: Apparatus and a method for generating a test case
- Patent Title (中): 用于产生测试用例的装置和方法
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Application No.: US12724096Application Date: 2010-03-15
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Publication No.: US08370808B2Publication Date: 2013-02-05
- Inventor: Akinori Ohta , Hiromasa Shin , Mikito Iwamasa , Yusuke Endoh
- Applicant: Akinori Ohta , Hiromasa Shin , Mikito Iwamasa , Yusuke Endoh
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-063281 20090316
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/00

Abstract:
A state-transition system includes a plurality of states and a first transition representing a state-change based on an external event occurred into a system to be checked. A plurality of requirement items includes a precondition and a postcondition in correspondence with the external event. By partially selecting the precondition and the postcondition from the plurality of requirement items, a state map to map a state onto truth values of the precondition and the postcondition is generated. By contracting the state-transition system with the state map, a quotient state-transition system is generated. The quotient state-transition system includes a plurality of second transitions among a plurality of groups each having states. By tracing each second transition in the quotient state-transition system, a representative transition path is generated. The representative transition path is regenerated as a transition path in the state-transition system. The transition path is output as a test case.
Public/Granted literature
- US20100235814A1 APPARATUS AND A METHOD FOR GENERATING A TEST CASE Public/Granted day:2010-09-16
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