Invention Grant
US08370102B1 Computer aided feature alignment process 有权
计算机辅助功能对齐过程

Computer aided feature alignment process
Abstract:
The different advantageous embodiments provide a method for alignment of platform features. A number of feature locations for a platform is identified using a platform model. A number of platform instructions for taking measurements at the number of feature locations is identified using the platform model. Instructions are generated having a number of measurement locations for each feature location in the number of feature locations for the platform.
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