Invention Grant
- Patent Title: Temperature detector in an integrated circuit
- Patent Title (中): 集成电路中的温度检测器
-
Application No.: US13053727Application Date: 2011-03-22
-
Publication No.: US08369170B2Publication Date: 2013-02-05
- Inventor: Chung Zen Chen
- Applicant: Chung Zen Chen
- Applicant Address: CA Ottawa, Ontario
- Assignee: MOSAID Technologies Incorporated
- Current Assignee: MOSAID Technologies Incorporated
- Current Assignee Address: CA Ottawa, Ontario
- Agent Harvey Auerback
- Main IPC: G11C7/04
- IPC: G11C7/04
Abstract:
A method for determining a temperature in a circuit comprises receiving a periodic signal. A frequency of the periodic signal is an increasing function of temperature. A number of oscillations of the periodic signal is determined during a time interval. A length of the time interval is an increasing function of temperature. The temperature is based on the determined number of oscillations.
Public/Granted literature
- US20110170366A1 TEMPERATURE DETECTOR IN AN INTEGRATED CIRCUIT Public/Granted day:2011-07-14
Information query
