Invention Grant
- Patent Title: Semiconductor memory device and method of testing a sense amplifier of the same
- Patent Title (中): 半导体存储器件及其测试方法
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Application No.: US12984217Application Date: 2011-01-04
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Publication No.: US08369167B2Publication Date: 2013-02-05
- Inventor: Tomohiro Sawada
- Applicant: Tomohiro Sawada
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-000467 20100105
- Main IPC: G11C29/02
- IPC: G11C29/02

Abstract:
A semiconductor device includes the following elements. A sense amplifier amplifies signal on a bit line. A column switch is between the bit line and a local input-output line. A sub-amplifier amplifies signal on the local input-output line. A write switch is between the local input-output line and a main input-output line. A write amplifier amplifies write data and supplies the amplified write data to the main input-output line when data write operation is performed. A test circuit activates the sense amplifier while the test circuit deactivating the sub-amplifier and the write amplifier when a data read operation is performed in test mode. The test circuit places the column switch and the write switch in conductive state.
Public/Granted literature
- US20110164464A1 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF TESTING THE SAME Public/Granted day:2011-07-07
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