Invention Grant
- Patent Title: Operation methods for memory cell and array thereof immune to punchthrough leakage
- Patent Title (中): 记忆单元及其阵列的操作方法免于穿透泄漏
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Application No.: US12264893Application Date: 2008-11-04
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Publication No.: US08369148B2Publication Date: 2013-02-05
- Inventor: Tien-Fan Ou , Wen-Jer Tsai , Jyun-Siang Huang
- Applicant: Tien-Fan Ou , Wen-Jer Tsai , Jyun-Siang Huang
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
An integrated circuit includes a memory cell structure including a first cell and a second cell. The first cell includes a first storage structure and a first gate over a substrate. The first gate is over the first storage structure. The second cell includes a second storage structure and a second gate over the substrate. The second gate is over the second storage structure. The first gate is separated from the second gate. A first doped region is adjacent to the first cell and is coupled to a first source. A second doped region is configured within the substrate and adjacent to the second cell. The second doped region is coupled to a second source. At least one third doped region is between the first cell and the second cell, wherein the third doped region is floating.
Public/Granted literature
- US20090116287A1 OPERATION METHODS FOR MEMORY CELL AND ARRAY THEREOF IMMUNE TO PUNCHTHROUGH LEAKAGE Public/Granted day:2009-05-07
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