Invention Grant
US08369148B2 Operation methods for memory cell and array thereof immune to punchthrough leakage 有权
记忆单元及其阵列的操作方法免于穿透泄漏

Operation methods for memory cell and array thereof immune to punchthrough leakage
Abstract:
An integrated circuit includes a memory cell structure including a first cell and a second cell. The first cell includes a first storage structure and a first gate over a substrate. The first gate is over the first storage structure. The second cell includes a second storage structure and a second gate over the substrate. The second gate is over the second storage structure. The first gate is separated from the second gate. A first doped region is adjacent to the first cell and is coupled to a first source. A second doped region is configured within the substrate and adjacent to the second cell. The second doped region is coupled to a second source. At least one third doped region is between the first cell and the second cell, wherein the third doped region is floating.
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