Invention Grant
US08369136B2 Resistive memory employing different pulse width signals for reading different memory cells
有权
采用不同脉冲宽度信号读取不同存储单元的电阻式存储器
- Patent Title: Resistive memory employing different pulse width signals for reading different memory cells
- Patent Title (中): 采用不同脉冲宽度信号读取不同存储单元的电阻式存储器
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Application No.: US12662985Application Date: 2010-05-14
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Publication No.: US08369136B2Publication Date: 2013-02-05
- Inventor: Byung-Gil Choi
- Applicant: Byung-Gil Choi
- Applicant Address: KR Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2009-0042202 20090514
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A semiconductor memory includes a memory cell array including a plurality of memory cells arranged in rows and columns, a plurality of bit lines, each bit line connected to a corresponding column of the memory cells; a column selection circuit configured to select at least one bit line in response to a column select signal; and a read circuit configured to precharge the selected bit line in response to a precharge signal, to apply a read bias to the precharged bit line in response to a read bias provision signal, and to read data from the memory cells. A resistance level of each of the memory cells varies according to data stored therein, and the read circuit reads data from a first memory cell of the plurality of memory cells in response to the precharge signal having a first pulse width and reads data from a second memory cell of the plurality of memory cells in response to the precharge signal having a second pulse width.
Public/Granted literature
- US20100290276A1 Semiconductor memory using resistance material Public/Granted day:2010-11-18
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