Invention Grant
- Patent Title: Semiconductor memory device with variable resistance element
- Patent Title (中): 具有可变电阻元件的半导体存储器件
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Application No.: US12818028Application Date: 2010-06-17
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Publication No.: US08369129B2Publication Date: 2013-02-05
- Inventor: Katsuyuki Fujita , Kenji Tsuchida
- Applicant: Katsuyuki Fujita , Kenji Tsuchida
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: JP2009-145469 20090618
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
According to one embodiment, a semiconductor memory device includes a variable resistance element configured to store data “0” and data “1” in accordance with a change in resistance value, a current generator configured to generate a reference current for determining data of the variable resistance element, and having an admittance middle between an admittance of a variable resistance element storing data “0” and an admittance of a variable resistance element storing data “1”, and a sense amplifier includes a first input terminal connected to the variable resistance element and a second input terminal connected to the current generator, and configured to compare currents of the first input terminal and the second input terminal.
Public/Granted literature
- US20100321980A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2010-12-23
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