Invention Grant
- Patent Title: Method and system for distinguishing spatial and thermal defects on perpendicular media
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Application No.: US13045485Application Date: 2011-03-10
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Publication No.: US08369038B2Publication Date: 2013-02-05
- Inventor: Stephen Frank Meier , David H. Ferry , Hassan Jalalian
- Applicant: Stephen Frank Meier , David H. Ferry , Hassan Jalalian
- Applicant Address: US CA Fremont
- Assignee: MRA Tek LLC
- Current Assignee: MRA Tek LLC
- Current Assignee Address: US CA Fremont
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G11B27/36
- IPC: G11B27/36

Abstract:
Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
Public/Granted literature
- US20120044594A1 Method and System for Distinguishing Spatial and Thermal Defects on Perpendicular Media Public/Granted day:2012-02-23
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