Invention Grant
- Patent Title: Method for assessing synchronized print defects
- Patent Title (中): 评估同步打印缺陷的方法
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Application No.: US12334761Application Date: 2008-12-15
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Publication No.: US08368955B2Publication Date: 2013-02-05
- Inventor: Wencheng Wu
- Applicant: Wencheng Wu
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Agency: Fay Sharpe LLP
- Main IPC: H04N1/60
- IPC: H04N1/60

Abstract:
As set forth herein, a computer implemented method is used to detect synchronized defects in documents. Profiles of single separation test targets are characterized for one or more toner colors. A spatially varying toner reproduction curve (TRC) is constructed for each profile on terms of an area coverage in versus area coverage out. A profile is extrapolated for each color of interest and a CMYK profile is applied to obtain a correlating L*a*b* profile for each color of interest.
Public/Granted literature
- US20100149560A1 METHOD FOR ASSESSING SYNCHRONIZED PRINT DEFECTS Public/Granted day:2010-06-17
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