Invention Grant
- Patent Title: Temperature detection circuit
- Patent Title (中): 温度检测电路
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Application No.: US12842631Application Date: 2010-07-23
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Publication No.: US08368454B2Publication Date: 2013-02-05
- Inventor: Makoto Tanaka
- Applicant: Makoto Tanaka
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Foley & Lardner LLP
- Priority: JP2009-181687 20090804
- Main IPC: H01L35/00
- IPC: H01L35/00 ; H01L37/00 ; H03K3/42 ; H03K17/78

Abstract:
A temperature detection circuit includes, a first source follower circuit supplied with a first constant current, a second source follower circuit supplied with a second constant current, and a circuit obtaining a difference between an output voltage from the first source follower circuit and an output voltage from the second source follower circuit. Measurement errors attributable to transistor threshold voltages are canceled out by obtaining a difference between output voltages.
Public/Granted literature
- US20110032023A1 TEMPERATURE DETECTION CIRCUIT Public/Granted day:2011-02-10
Information query
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