Invention Grant
- Patent Title: Transmission line for dielectric measurement and dielectric measuring device having the transmission line
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Application No.: US12283009Application Date: 2008-09-09
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Publication No.: US08368410B2Publication Date: 2013-02-05
- Inventor: Yoshihito Hayashi , Shinji Omori , Ikuya Oshige
- Applicant: Yoshihito Hayashi , Shinji Omori , Ikuya Oshige
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: JP2007-234702 20070910
- Main IPC: G01R27/08
- IPC: G01R27/08 ; G01R27/26
Abstract:
A transmission line substrate includes at least an insulating layer of a predetermined thickness, a pair of conductor layers arranged in a state of being opposed to each other such that the insulating layer is interposed between the conductor layers, the pair of conductor layers functioning as a high-frequency transmission line, and a fault part formed so as to make the conductor layer on one side disconnected, into which a sample to be measured can be introduced.
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