Invention Grant
- Patent Title: Device for measuring the thickness of a layer of material
- Patent Title (中): 用于测量材料层厚度的装置
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Application No.: US12665891Application Date: 2008-06-20
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Publication No.: US08368407B2Publication Date: 2013-02-05
- Inventor: Giovanni Cristini
- Applicant: Giovanni Cristini
- Applicant Address: IT Milan
- Assignee: S.A. Giuseppe Cristini S.p.A.
- Current Assignee: S.A. Giuseppe Cristini S.p.A.
- Current Assignee Address: IT Milan
- Agency: Marshall, Gerstein & Borun LLP
- Priority: ITMI07A1250 20070621
- International Application: PCT/IB2008/001615 WO 20080620
- International Announcement: WO2008/155645 WO 20081224
- Main IPC: G01R27/04
- IPC: G01R27/04 ; G01R27/22
Abstract:
A device for measuring the thickness of a layer of material, the device including a reading head and control unit connected to the reading head. The reading head includes a microwave planar type sensor and an A/D converter connected to the microwave sensor and arranged in proximity of the microwave sensor.
Public/Granted literature
- US20100207642A1 Device for Measuring the Thickness of a Layer of Material Public/Granted day:2010-08-19
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