Invention Grant
- Patent Title: Frequency characteristics measuring device
- Patent Title (中): 频率特性测量装置
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Application No.: US12865972Application Date: 2009-09-14
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Publication No.: US08368382B2Publication Date: 2013-02-05
- Inventor: Satoru Aoyama , Wataru Doi
- Applicant: Satoru Aoyama , Wataru Doi
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: patenttm.us
- Priority: JP2008-247072 20080926
- International Application: PCT/JP2009/065989 WO 20090914
- International Announcement: WO2010/035646 WO 20100401
- Main IPC: G01R23/02
- IPC: G01R23/02 ; G01R23/00 ; G01R23/14 ; G01R13/24

Abstract:
A spectrum analyzer includes: two sets of measuring units having mixers, local oscillators, and IF sections for separately measuring frequency characteristics of two input signals; a trigger control section which generates a trigger signal for specifying a measurement start timing in each of the two sets of measuring units; a sweep control section which simultaneously sends an instruction to the two local oscillators when a trigger signal is inputted and performs a sweep control so that the two local oscillators output local oscillation signals of the same frequency at the same timing. This provides a frequency characteristics measuring device which can simplify the configuration for performing a measurement and reduce the undue effort required for the measurement.
Public/Granted literature
- US20110001468A1 FREQUENCY CHARACTERISTICS MEASURING DEVICE Public/Granted day:2011-01-06
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