Invention Grant
- Patent Title: Driver circuit and test apparatus
- Patent Title (中): 驱动电路和测试仪器
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Application No.: US12553755Application Date: 2009-09-03
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Publication No.: US08368366B2Publication Date: 2013-02-05
- Inventor: Yuji Kuwana , Naoki Matsumoto , Yasuhiro Urabe
- Applicant: Yuji Kuwana , Naoki Matsumoto , Yasuhiro Urabe
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G05F1/40
- IPC: G05F1/40

Abstract:
Provided is a driver circuit that outputs, from an output end, an output signal corresponding to an input signal supplied thereto, comprising an output resistance section that is provided between a constant voltage source and the output end; an output switching section that switches voltage of the output end according to the input signal; and a switching section that switches a resistance value of the output resistance section. The output resistance section includes an output resistance FET having a source/drain connection between the constant voltage source and the output end, and the switching section supplies a control voltage to a gate of the output resistance FET such that the resistance between the source and the drain of the output resistance FET switches to a designated value.
Public/Granted literature
- US20110050194A1 DRIVER CIRCUIT AND TEST APPARATUS Public/Granted day:2011-03-03
Information query
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