Invention Grant
- Patent Title: Resin sealing method of semiconductor device
-
Application No.: US12687466Application Date: 2010-01-14
-
Publication No.: US08368235B2Publication Date: 2013-02-05
- Inventor: Teruaki Chino
- Applicant: Teruaki Chino
- Applicant Address: JP Nagano-shi
- Assignee: Shinko Electric Industries Co., Ltd.
- Current Assignee: Shinko Electric Industries Co., Ltd.
- Current Assignee Address: JP Nagano-shi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2009-008000 20090116
- Main IPC: H01L23/29
- IPC: H01L23/29 ; H01L21/00

Abstract:
A resin sealing method of a semiconductor device includes: positioning semiconductor devices at predetermined positions of an adhesive layer formed on a support body and adhering the semiconductor devices thereto, sealing a part of each of the semiconductor devices with resin by curing a first seal resin in a fluidization state so as to fix the semiconductor devices adhered to the predetermined positions of the adhesive layer formed on the support body, setting the semiconductor devices fixed to the predetermined positions of the adhesive layer formed on the support body in a mold and sealing the exposure parts of the semiconductor devices exposed from the first seal resin with a second seal resin, and removing the support body and the adhesive layer from the semiconductor devices sealed with the resin.
Public/Granted literature
- US20100184256A1 RESIN SEALING METHOD OF SEMICONDUCTOR DEVICE Public/Granted day:2010-07-22
Information query
IPC分类: