Invention Grant
US08368219B2 Buried silicide local interconnect with sidewall spacers and method for making the same
有权
埋入硅化物与侧壁间隔物的局部互连及其制造方法
- Patent Title: Buried silicide local interconnect with sidewall spacers and method for making the same
- Patent Title (中): 埋入硅化物与侧壁间隔物的局部互连及其制造方法
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Application No.: US13281491Application Date: 2011-10-26
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Publication No.: US08368219B2Publication Date: 2013-02-05
- Inventor: Arvind Halliyal , Zoran Krivokapic , Matthew S. Buynoski , Nicholas H. Tripsas , Minh Van Ngo , Mark T. Ramsbey , Jeffrey A. Shields , Jusuke Ogura
- Applicant: Arvind Halliyal , Zoran Krivokapic , Matthew S. Buynoski , Nicholas H. Tripsas , Minh Van Ngo , Mark T. Ramsbey , Jeffrey A. Shields , Jusuke Ogura
- Applicant Address: US CA Sunnyvale US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.,Spansion LLC
- Current Assignee: Advanced Micro Devices, Inc.,Spansion LLC
- Current Assignee Address: US CA Sunnyvale US CA Sunnyvale
- Agency: Volpe and Koenig, P.C.
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52

Abstract:
A buried local interconnect and method of forming the same counterdopes a region of a doped substrate to form a counterdoped isolation region. A hardmask is formed and patterned on the doped substrate, with a recess being etched through the patterned hardmask into the counterdoped region. Dielectric spacers are formed on the sidewalls of the recess, with a portion of the bottom of the recess being exposed. A metal is then deposited in the recess and reacted to form silicide at the bottom of the recess. The recess is filled with fill material, which is polished. The hardmask is then removed to form a silicide buried local interconnect.
Public/Granted literature
- US20120038051A1 BURIED SILICIDE LOCAL INTERCONNECT WITH SIDEWALL SPACERS AND METHOD FOR MAKING THE SAME Public/Granted day:2012-02-16
Information query
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