Invention Grant
- Patent Title: Thin film of aluminum nitride and process for producing the thin film of aluminum nitride
- Patent Title (中): 氮化铝薄膜及其生产氮化铝薄膜的工艺
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Application No.: US12602104Application Date: 2009-02-18
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Publication No.: US08367577B2Publication Date: 2013-02-05
- Inventor: Issei Satoh , Naho Mizuhara , Keisuke Tanizaki , Michimasa Miyanaga , Takashi Sakurada , Yoshiyuki Yamamoto , Hideaki Nakahata
- Applicant: Issei Satoh , Naho Mizuhara , Keisuke Tanizaki , Michimasa Miyanaga , Takashi Sakurada , Yoshiyuki Yamamoto , Hideaki Nakahata
- Applicant Address: JP Osaka
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka
- Agent James W. Judge
- Priority: JP2008-046335 20080227; JP2009-012038 20090122
- International Application: PCT/JP2009/052747 WO 20090218
- International Announcement: WO2009/107525 WO 20090903
- Main IPC: C04B35/581
- IPC: C04B35/581

Abstract:
Flat, thin AlN membranes and methods of their manufacture are made available. An AlN thin film (2) contains between 0.001 wt. % and 10 wt. % additive atomic element of one or more type selected from Group-III atoms, Group-IV atoms and Group-V atoms. Onto a base material (1), the AlN thin film (2) is formable utilizing a plasma generated by setting inside a vacuum chamber a sintered AlN ceramic containing between 0.001 wt. % and 10 wt. % additive atomic element of one or more type selected from Group-III atoms, Group-IV atoms and Group-V atoms, and with the base material having been set within the vacuum chamber, irradiating the sintered AlN ceramic with a laser.
Public/Granted literature
- US20100209622A1 Thin Film of Aluminum Nitride and Process for Producing the Thin Film of Aluminum Nitride Public/Granted day:2010-08-19
Information query
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