Invention Grant
- Patent Title: Target and three-dimensional-shape measurement device using the same
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Application No.: US12379670Application Date: 2009-02-26
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Publication No.: US08351025B2Publication Date: 2013-01-08
- Inventor: Hitoshi Ootani , Tadayuki Ito
- Applicant: Hitoshi Ootani , Tadayuki Ito
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Topcon
- Current Assignee: Kabushiki Kaisha Topcon
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2008-047039 20080228
- Main IPC: G01C3/08
- IPC: G01C3/08

Abstract:
A target set in a to-be-measured object and used for acquiring a reference value of point-cloud data, the target includes a small circle surrounded by a frame and having the center of the target, a large circle surrounded by the frame and disposed concentrically with the small circle so as to surround the small circle, a low-luminance reflective region located between the frame and the large circle and having the lowest reflectivity, a high-luminance reflective region located between the large circle and the small circle and having the highest reflectivity, and an intermediate-luminance reflective region located inside the small circle and having an intermediate reflectivity which is higher than the reflectivity of the low-luminance reflective region and which is lower than the reflectivity of the high-luminance reflective region.
Public/Granted literature
- US20090220145A1 Target and three-dimensional-shape measurement device using the same Public/Granted day:2009-09-03
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