Invention Grant
- Patent Title: Method of determining the feasibility of a proposed structure analysis process
- Patent Title (中): 确定提出的结构分析过程的可行性的方法
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Application No.: US12300963Application Date: 2007-05-16
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Publication No.: US08346521B2Publication Date: 2013-01-01
- Inventor: Peter John Statham , Charles Penman
- Applicant: Peter John Statham , Charles Penman
- Applicant Address: GB Oxon
- Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee Address: GB Oxon
- Agency: Blank Rome LLP
- Priority: GB0609744.8 20060516
- International Application: PCT/GB2007/001803 WO 20070516
- International Announcement: WO2007/132243 WO 20071122
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06F17/10 ; G06G7/48 ; G06G7/50

Abstract:
A method of determining the feasibility of a proposed structure analysis process is disclosed. The process involved the electron beam excitation of x-rays from a multi-layered structure. The method comprises generating predicted x-ray data represents the x-ray excitation response of the multi-layered structure according to one or more sets of process conditions. The x-ray data are generated using structure data defining the structure and composition of the layers. The effects upon the x-ray data of changes to the structure data are then analyzed in accordance with one or more predetermined feasibility criteria, so as to determine the feasibility of performing the proposed structure analysis process upon the multi-layered structure.
Public/Granted literature
- US20100017172A1 METHOD OF DETERMINING THE FEASIBILITY OF A PROPOSED STRUCTURE ANALYSIS PROCESS Public/Granted day:2010-01-21
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