Invention Grant
- Patent Title: Scanning probe in pulsed-force mode, digital and in real time
- Patent Title (中): 以脉冲力模式扫描探头，数字和实时
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Application No.: US12804110Application Date: 2010-07-14
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Publication No.: US08286261B2Publication Date: 2012-10-09
- Inventor: Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
- Applicant: Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
- Applicant Address: DE Ulm
- Assignee: Witec Wissenchaftliche Instrumente und Technologie GmbH
- Current Assignee: Witec Wissenchaftliche Instrumente und Technologie GmbH
- Current Assignee Address: DE Ulm
- Agency: Opticus IP Law PLLC
- Priority: DE10062049 20001213; DE102005055460 20051122
- Main IPC: G01Q60/00
- IPC: G01Q60/00
Abstract:
A microscope, in particular a scanning probe microscope, comprising a programmable logic device.
Public/Granted literature
- US20100313311A1 Scanning probe in pulsed-force mode, digital and in real time Public/Granted day:2010-12-09
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