Invention Grant
- Patent Title: Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns
- Patent Title (中): 利用异常模式的过去位置检测诊断目标图像内的异常模式的方法和装置
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Application No.: US12042465Application Date: 2008-03-05
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Publication No.: US08285013B2Publication Date: 2012-10-09
- Inventor: Yoshiyuki Moriya
- Applicant: Yoshiyuki Moriya
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2007/054010 20070305
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An image processing apparatus having improved detection performance for detecting an abnormal shadow, such as a tumor, and reducing a burden on the user is disclosed. In the image processing apparatus, an aligning unit aligns a previous image and a current diagnosis image with each other, and a corresponding position calculating unit calculates a position on a subject in the current diagnosis image corresponding to the position of an abnormal shadow on the subject in the previous image based on positional information of the abnormal shadow on the subject in the previous image and alignment information. A current diagnosis image abnormal shadow detecting unit detects the abnormal shadow in the current diagnosis image from the vicinity of the corresponding position in the current diagnosis image.
Public/Granted literature
- US20080226145A1 IMAGE PROCESSING APPARATUS AND COMPUTER READABLE MEDIA CONTAINING IMAGE PROCESSING PROGRAM Public/Granted day:2008-09-18
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