Invention Grant
US08285013B2 Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns 有权
利用异常模式的过去位置检测诊断目标图像内的异常模式的方法和装置

  • Patent Title: Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns
  • Patent Title (中): 利用异常模式的过去位置检测诊断目标图像内的异常模式的方法和装置
  • Application No.: US12042465
    Application Date: 2008-03-05
  • Publication No.: US08285013B2
    Publication Date: 2012-10-09
  • Inventor: Yoshiyuki Moriya
  • Applicant: Yoshiyuki Moriya
  • Applicant Address: JP Tokyo
  • Assignee: FUJIFILM Corporation
  • Current Assignee: FUJIFILM Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2007/054010 20070305
  • Main IPC: G06K9/00
  • IPC: G06K9/00
Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns
Abstract:
An image processing apparatus having improved detection performance for detecting an abnormal shadow, such as a tumor, and reducing a burden on the user is disclosed. In the image processing apparatus, an aligning unit aligns a previous image and a current diagnosis image with each other, and a corresponding position calculating unit calculates a position on a subject in the current diagnosis image corresponding to the position of an abnormal shadow on the subject in the previous image based on positional information of the abnormal shadow on the subject in the previous image and alignment information. A current diagnosis image abnormal shadow detecting unit detects the abnormal shadow in the current diagnosis image from the vicinity of the corresponding position in the current diagnosis image.
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