A method may include transmitting a first data burst and a second data burst to a circuit or network under test, the first data burst having a smaller size than the second data burst. The method may also include determining a first latency associated with the first data burst based on time information associated with the first data burst and determining a second latency associated with the second data burst based on time information associated with the second data burst. The method may further include calculating an estimated throughput of the circuit or network under test based on a difference in the first and second latencies, a difference in size for the first and second data bursts, and a first data rate at which the first and second data bursts were transmitted.