Invention Grant
- Patent Title: Operating scan paths sequentially and capturing simultaneously
- Patent Title (中): 依次操作扫描路径并同时捕获
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Application No.: US13184077Application Date: 2011-07-15
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Publication No.: US08261144B2Publication Date: 2012-09-04
- Inventor: Lee D. Whetsel
- Applicant: Lee D. Whetsel
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A Scan-BIST architecture is adapted into a low power Scan-BIST architecture. A generator 102, compactor 106, and controller 110 remain the same as in the known art. The changes between the known art Scan-BIST architecture and the low power Scan-BIST architecture involve modification of the known scan path into scan path 502, to insert scan paths A 506, B 508 and C 510, and the insertion of an adaptor circuit 504 in the control path 114 between controller 110 and scan path 502.
Public/Granted literature
- US20110283154A1 ADAPTING SCAN-BIST ARCHITECTURES FOR LOW POWER OPERATION Public/Granted day:2011-11-17
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