Invention Grant
US08261119B2 Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module
失效
用于测试装置的测试装置具有同步模块，其基于从数字测试模块接收的同步信号，将模拟测试模块与数字测试模块同步
- Patent Title: Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module
- Patent Title (中): 用于测试装置的测试装置具有同步模块，其基于从数字测试模块接收的同步信号，将模拟测试模块与数字测试模块同步
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Application No.: US12557474Application Date: 2009-09-10
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Publication No.: US08261119B2Publication Date: 2012-09-04
- Inventor: Satoshi Iwamoto
- Applicant: Satoshi Iwamoto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: G06F1/12
- IPC: G06F1/12
Abstract:
There is provided a test apparatus for testing a device under test, including a plurality of test modules that test the device under test, and a synchronization module that is connected to each of the plurality of test modules, where the synchronization module synchronizes together the plurality of test modules. Here, based on a synchronization signal received from a digital module, the synchronization module synchronizes an analog module to the digital module, and the digital module is one of the plurality of test modules that exchanges a digital signal with the device under test, and the analog module is one of the plurality of test modules that performs an analog test on the device under test.
Public/Granted literature
- US20110060933A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-03-10
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