Invention Grant
US08259199B2 Pixel array with reduced sensitivity to defects 有权
具有降低的缺陷敏感度的像素阵列

  • Patent Title: Pixel array with reduced sensitivity to defects
  • Patent Title (中): 具有降低的缺陷敏感度的像素阵列
  • Application No.: US12222545
    Application Date: 2008-08-12
  • Publication No.: US08259199B2
    Publication Date: 2012-09-04
  • Inventor: Guy Meynants
  • Applicant: Guy Meynants
  • Applicant Address: BE Antwerp
  • Assignee: CMOSIS NV
  • Current Assignee: CMOSIS NV
  • Current Assignee Address: BE Antwerp
  • Agency: Bacon & Thomas, PLLC
  • Priority: GB0724983.2 20071221
  • Main IPC: H04N9/64
  • IPC: H04N9/64
Pixel array with reduced sensitivity to defects
Abstract:
An array of active pixels comprises rows of pixels and row select lines for selecting rows of pixels. Each active pixel comprises a buffer amplifier for buffering an output of a photo-sensitive element. An output of the buffer amplifier can be selectively put into a high impedance state, by control of the input of the buffer amplifier, when there is a defect in the row select line for that pixel. This allows other rows, which are defect-free, to remain operating as normal. A disable line can be provided for a row of pixels and each pixel can have a switch connected to the disable line. Alternatively, a first supply line powers a row of pixels. Each pixel comprises a reset switch connected between a photo-sensitive element and the first supply line for resetting the photo-sensitive element. The array is configured such that, in the event of a defect in a row select line, the first supply line is set to ground, or a low voltage, and the reset switch is turned on to put the buffer amplifier into the high impedance state.
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