Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12694154Application Date: 2010-01-26
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Publication No.: US08258803B2Publication Date: 2012-09-04
- Inventor: Mamoru Hiraide , Takeshi Yaguchi
- Applicant: Mamoru Hiraide , Takeshi Yaguchi
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: G01R31/3187
- IPC: G01R31/3187

Abstract:
Provided is a test apparatus and a test method related to the test apparatus for testing a device under test, including: a plurality of test modules that exchange a signal with the device under test; a test control section that outputs a group read instruction for collectively reading data stored in two or more of the test modules; and a control interface section that reads the data from the two or more test modules according to the group read instruction, and collectively sends the read data to the test control section.
Public/Granted literature
- US20110181311A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-07-28
Information query
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