Invention Grant
- Patent Title: Avalanche photodiode
- Patent Title (中): 雪崩光电二极管
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Application No.: US12672102Application Date: 2008-06-18
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Publication No.: US08258594B2Publication Date: 2012-09-04
- Inventor: Rainer Richter , Ladislav Andricek , Gerhard Lutz
- Applicant: Rainer Richter , Ladislav Andricek , Gerhard Lutz
- Applicant Address: DE Munich
- Assignee: PNSensor GmbH
- Current Assignee: PNSensor GmbH
- Current Assignee Address: DE Munich
- Agency: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.
- Priority: DE102007037020 20070806
- International Application: PCT/EP2008/004903 WO 20080618
- International Announcement: WO2009/018872 WO 20090212
- Main IPC: H01L31/0232
- IPC: H01L31/0232

Abstract:
The invention relates to an avalanche photodiode (1) for detecting radiation, including a semiconductor substrate (11), an upper diode layer (15), an oppositely doped, laterally delimited lower diode layer (16), an avalanche region situated between the upper diode layer (15) and the lower diode layer (16), wherein the radiation to be detected triggers an avalanche breakdown in the avalanche region, and also including a contact-making layer (12) at the underside (10) of the semiconductor substrate (11), a laterally delimited quenching resistance layer (18) arranged in the semiconductor substrate (11) between the lower diode layer (16) and the contact-making layer (12), wherein the quenching resistance layer (18) quenches the radiation-generated avalanche breakdown in the avalanche region, and also including a depletion electrode (15) arranged laterally alongside the laterally delimited lower diode layer (16), such that the depletion electrode (15) depletes the semiconductor substrate (11) laterally alongside the laterally delimited lower diode layer (16), while the quenching resistance layer (18) is screened from the depletion electrode (15) by the lower diode layer (16) and is therefore not depleted.
Public/Granted literature
- US20110095388A1 AVALANCHE PHOTODIODE Public/Granted day:2011-04-28
Information query
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