Invention Grant
US08258473B2 Method and apparatus for rapid preparation of multiple specimens for transmission electron microscopy 有权
用于透射电子显微镜快速制备多个样品的方法和装置

Method and apparatus for rapid preparation of multiple specimens for transmission electron microscopy
Abstract:
A method and apparatus for in-situ lift-out rapid preparation of TEM samples. The invention uses adhesives and/or spring-loaded locking-clips in order to place multiple TEM-ready sample membranes on a single TEM support grid and eliminates the use of standard FIB-assisted metal deposition as a bonding scheme. Therefore, the invention circumvents the problem of sputtering from metal deposition steps and also increases overall productivity by allowing for multiple samples to be produced without opening the FIB/SEM vacuum chamber.
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