Invention Grant
US08258472B2 Charged particle radiation device and image capturing condition determining method using charged particle radiation device
有权
带电粒子辐射装置和使用带电粒子辐射装置的图像捕获条件确定方法
- Patent Title: Charged particle radiation device and image capturing condition determining method using charged particle radiation device
- Patent Title (中): 带电粒子辐射装置和使用带电粒子辐射装置的图像捕获条件确定方法
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Application No.: US13142153Application Date: 2009-11-19
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Publication No.: US08258472B2Publication Date: 2012-09-04
- Inventor: Tamotsu Shindo , Yuji Tange
- Applicant: Tamotsu Shindo , Yuji Tange
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2008-331826 20081226
- International Application: PCT/JP2009/006207 WO 20091119
- International Announcement: WO2010/073478 WO 20100701
- Main IPC: G01N23/22
- IPC: G01N23/22 ; H01J37/28 ; H01J37/26

Abstract:
A charged particle radiation device wherein the position or the size of a FOV can be easily determined even if a number of measuring points are provided on a sample, and an image capturing condition determining method using the charged particle radiation device are provided. An image capturing condition determining method wherein the field of view of a charged particle radiation device is determined so as to include a plurality of measuring points, characterized in that whether or not the measuring points are overlapped with four sides of the field of view is judged; the field of view is moved so that the measuring points are moved to the inside or outside of the field of view; and the position of the field of view after being moved is determined as a position of the field of view of the charged particle radiation device, and a device to realize the method are proposed. Further, a method for judging whether or not the measuring points are overlapped with the four sides, and changing the size of the field of view so as not to overlap the measuring points with each side, and a device therefor are proposed.
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