Invention Grant
- Patent Title: Statistical control of the integrity of a program
- Patent Title (中): 统计控制程序的完整性
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Application No.: US10877884Application Date: 2004-06-25
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Publication No.: US08239833B2Publication Date: 2012-08-07
- Inventor: Yannick Teglia , Pierre-Yvan Liardet
- Applicant: Yannick Teglia , Pierre-Yvan Liardet
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics S.A.
- Current Assignee: STMicroelectronics S.A.
- Current Assignee Address: FR Montrouge
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: FR0350258 20030626
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F17/00
Abstract:
A method for controlling the execution of a program implementing successive operations, including, during program execution, comparing each operation with a pre-established list, and for each operation contained in the list, incrementing and memorizing a number of occurrences of this operation; and at the end of the program execution, comparing the number of occurrences of the current program execution for each operation with previously-stored ranges of numbers of occurrences assigned to each operation.
Public/Granted literature
- US20040268313A1 Statistical control of the integrity of a program Public/Granted day:2004-12-30
Information query
