Invention Grant
- Patent Title: System and method of eliminating interference for impurities measurement in noble gases
- Patent Title (中): 消除惰性气体杂质测量干扰的系统和方法
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Application No.: US12280712Application Date: 2007-02-28
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Publication No.: US08239171B2Publication Date: 2012-08-07
- Inventor: Yves Gamache , André Fortier
- Applicant: Yves Gamache , André Fortier
- Applicant Address: CA Quebec
- Assignee: Panalytique Inc.
- Current Assignee: Panalytique Inc.
- Current Assignee Address: CA Quebec
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- International Application: PCT/CA2007/000314 WO 20070228
- International Announcement: WO2007/098586 WO 20070907
- Main IPC: H03F1/26
- IPC: H03F1/26

Abstract:
The invention provides a system and a method of eliminating interference for impurities measurement in noble gases based on emission spectroscopy which provide very stable, sensitive and interference free results. The method mainly relies on the use of a combination of particularly designed means serially connected for cancelling interferences and proper means for correcting linearity issues. The proposed method is particularly advantageous since it offers long-term stability while providing very accurate and reliable results, even at sub-ppb and up to 10,000 ppm levels, whatever the surrounding conditions and the additional impurities that could be present in the gas under analysis.
Public/Granted literature
- US20090132206A1 SYSTEM AND METHOD OF ELIMINATING INTERFERENCE FOR IMPURITIES MEASUREMENT IN NOBLE GASES Public/Granted day:2009-05-21
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