Invention Grant
- Patent Title: Display testing apparatus and method
- Patent Title (中): 显示测试仪器及方法
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Application No.: US12205925Application Date: 2008-09-08
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Publication No.: US08238640B2Publication Date: 2012-08-07
- Inventor: Jian Sun , Hua-Dong Cheng , Wen-Chuan Lian , Han-Che Wang , Xiao-Guang Li , Kuan-Hong Hsieh
- Applicant: Jian Sun , Hua-Dong Cheng , Wen-Chuan Lian , Han-Che Wang , Xiao-Guang Li , Kuan-Hong Hsieh
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200710123706 20070928
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A display testing method applied on an apparatus is provided, the apparatus being connected with an image capturing device. The method includes: controlling the image capturing device to capture and store images of displays to be tested; determining a first vertex of a test area on the captured image, determining a test area according to the determined first vertex; and testing parameters of the display according to the test area.
Public/Granted literature
- US20090087078A1 DISPLAY TESTING APPARATUS AND METHOD Public/Granted day:2009-04-02
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