Invention Grant
US08238162B2 System and method for detecting disturbed memory cells of a semiconductor memory device
有权
用于检测半导体存储器件的干扰存储单元的系统和方法
- Patent Title: System and method for detecting disturbed memory cells of a semiconductor memory device
- Patent Title (中): 用于检测半导体存储器件的干扰存储单元的系统和方法
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Application No.: US12868228Application Date: 2010-08-25
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Publication No.: US08238162B2Publication Date: 2012-08-07
- Inventor: Chun-Hsiung Hung , Jeng-Kuan Lin , Kuen-Long Chang
- Applicant: Chun-Hsiung Hung , Jeng-Kuan Lin , Kuen-Long Chang
- Applicant Address: TW
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW
- Agency: Baker & McKenzie LLP
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/04 ; G11C16/06 ; G11C5/06

Abstract:
A method of detecting a disturb condition of a memory cell includes application of multiple sets of conditions to the memory cell and determining whether the memory cell behaves as a programmed memory cell in response to the sets of conditions. A disturbed memory cell can be detected if the memory cell responds as a programmed memory cell in response to one of the sets of conditions, but responds as an erased memory cell in response to another of the sets of conditions.
Public/Granted literature
- US20120051130A1 SYSTEM AND METHOD FOR DETECTING DISTURBED MEMORY CELLS OF A SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2012-03-01
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