Invention Grant
US08238162B2 System and method for detecting disturbed memory cells of a semiconductor memory device 有权
用于检测半导体存储器件的干扰存储单元的系统和方法

System and method for detecting disturbed memory cells of a semiconductor memory device
Abstract:
A method of detecting a disturb condition of a memory cell includes application of multiple sets of conditions to the memory cell and determining whether the memory cell behaves as a programmed memory cell in response to the sets of conditions. A disturbed memory cell can be detected if the memory cell responds as a programmed memory cell in response to one of the sets of conditions, but responds as an erased memory cell in response to another of the sets of conditions.
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