Invention Grant
- Patent Title: Method and apparatus for measuring density
- Patent Title (中): 测量密度的方法和装置
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Application No.: US12922898Application Date: 2009-04-15
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Publication No.: US08237926B2Publication Date: 2012-08-07
- Inventor: Minoru Danno , Kenji Muta , Masazumi Tanoura , Masatoshi Katsuki , Yuuko Ujihara
- Applicant: Minoru Danno , Kenji Muta , Masazumi Tanoura , Masatoshi Katsuki , Yuuko Ujihara
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Heavy Industries, Ltd.
- Current Assignee: Mitsubishi Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2008-278798 20081029
- International Application: PCT/JP2009/057949 WO 20090415
- International Announcement: WO2010/050255 WO 20100506
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method and apparatus for measuring density which can simultaneously measure gaseous substance density and solid particulate material density and further can simultaneously measure the densities of a plurality of materials such as black smoke, white smoke, and water vapor. The method includes irradiating a laser having at least one wavelength equivalent to an absorption wavelength of each gaseous substance to be measured.
Public/Granted literature
- US20110019193A1 METHOD AND APPARATUS FOR MEASURING DENSITY Public/Granted day:2011-01-27
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