Invention Grant
- Patent Title: Method for determining the locations of at least two impacts
- Patent Title (中): 确定至少两个影响位置的方法
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Application No.: US12339874Application Date: 2008-12-19
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Publication No.: US08237676B2Publication Date: 2012-08-07
- Inventor: Remi Duheille , Olivier Schevin , Ros Kiri Ing
- Applicant: Remi Duheille , Olivier Schevin , Ros Kiri Ing
- Applicant Address: US CA Menlo Park
- Assignee: Elo Touch Solutions, Inc.
- Current Assignee: Elo Touch Solutions, Inc.
- Current Assignee Address: US CA Menlo Park
- Agency: Marshall, Gerstein & Borun LLP
- Priority: EP07291611 20071221
- Main IPC: G06F3/041
- IPC: G06F3/041

Abstract:
A method for determining the locations of at least two impacts F1 and F2 on a surface using one or more sensors Si, i=1 to n, with n being the number of sensors, and the impacts F1 and F2 generating a signal being sensed by the one or more sensors, wherein each sensor provides a sensed signal si(t), i=1 to n, with n being the number of sensors. To be able to determine simultaneous impacts of different amplitudes the method includes identifying the location x of one impact, and determining a modified sensed signal si′(t) for each sensor in which the contribution due to the identified impact is reduced and which is based on a comparison, in particular a correlation, of each of the sensed signals si(t) and a predetermined reference signal rij(t) corresponding to a reference impact Rj at location j. The method can also be based on couples of sensed signals.
Public/Granted literature
- US20090195517A1 METHOD FOR DETERMINING THE LOCATIONS OF AT LEAST TWO IMPACTS Public/Granted day:2009-08-06
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